Imaging x-ray crystal spectrometers for KSTAR

Review of Scientific Instruments

Volumn 74, Issue 3 II, 2003, Pages 1997-2000

  Lee, S G ^a   Bak, J G ^a   Bitter, M ^b   Moon, M K ^c   Nam, U W ^d   Jin, K C ^d   Kong, K N ^d   Seon, K I ^d  

^a Korea Basic Science Institute (KBSI)   (South Korea)

^b PRINCETON PLASMA PHYSICS LABORATORY   (United States)

^c Korea Atomic Energy Research Institute   (South Korea)

^d Korea Astronomy and Space Science Institute (KASI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

HELIUM; IMAGING TECHNIQUES; PLASMAS; PROPORTIONAL COUNTERS; QUARTZ;

X-RAY IMAGING CRYSTAL SPECTROMETERS;

X RAY SPECTROMETERS;

EID: 0037349942     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1535243     Document Type: Conference Paper

References (6)

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2. S. G. Lee et al., Rev. Sci. Instrum. 70, 1397 (1999).
3. M. Bitter, K. W. Hill, A. L. Roquemore, P. Beiersdorfer, S. M. Kahn, S. R. Elliot, and B. Fraenkel, Rev. Sci. Instrum. 70, 292 (1999).
4. H. H. Johann, Z. Phys. 69, 185 (1931).
5. E. Baronova, Kurchatov Institute, Russia (private communication).
6. S. G. Lee et al., Proc. SPIE 4504, 159 (2001).