Spatially resolved spectra from a new x-ray imaging crystal spectrometer for measurements of ion and electron temperature profiles (invited)

Review of Scientific Instruments

Volumn 75, Issue 10 II, 2004, Pages 3660-3665

  Bitter, M ^a   Hill, K W ^a   Stratton, B ^a   Roquemore, A L ^a   Mastrovito, D ^a   Lee, S G ^b   Bak, J G ^b   Moon, M K ^c   Nam, U W ^d   Smith, G ^e   Rice, J E ^f   Beiersdorfer, P ^g   Fraenkel, B S ^h  

^a PRINCETON PLASMA PHYSICS LABORATORY   (United States)

^b Korea Basic Science Institute (KBSI)   (South Korea)

^c Korea Atomic Energy Research Institute   (South Korea)

^d Korea Astronomy and Space Science Institute (KASI)   (South Korea)

^e BROOKHAVEN NATIONAL LABORATORY   (United States)

^f MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^g LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^h HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TEMPERATURE PROFILES; ION TEMPERATURE PROFILES; TOKAMAK PLASMAS; X-RAY IMAGING CRYSTAL SPECTROMETER;

CRYSTALS; ELECTRONS; IMAGING TECHNIQUES; NEUTRON BEAMS; PLASMAS; QUARTZ; TEMPERATURE MEASUREMENT; TOKAMAK DEVICES;

X RAY SPECTROMETERS;

EID: 9944248242     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1791747     Document Type: Conference Paper

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