An ultra-fast, on-chip BiST for RF low noise amplifiers

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 2005, Pages 485-490

  Gopalan, Anand ^a   Das, Tejasvi ^a   Washburn, Clyde ^a   Mukund, P R ^a  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BASE-BAND CIRCUITRY; LOW NOISE AMPLIFIERS (LNA); POWER GAIN;

GAIN CONTROL; MICROPROCESSOR CHIPS; PARAMETER ESTIMATION; RADIO FREQUENCY AMPLIFIERS;

BUILT-IN SELF TEST;

EID: 27944470539     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICVD.2005.52     Document Type: Conference Paper

References (6)

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2. Heutmaker, Michael S., Le, Duy K., "Architecture for self-test of a wireless communication system using sampled IQ modulation and boundary scan", IEEE Communications Magazine, v 37, n 6, Jun, 1999, p 98-102
3. Jarwala, Madhuri; Le, Duy; Heutmaker, Michael S., "End-to-end test strategy for wireless systems" IEEE International Test Conference (TC), 1995, p 940-946.
4. Ferrario, John; Wolf, Randy; Moss, Steve; Slamani, Mustapha, "A low-cost test solution for wireless phone RFICs", IEEE Communications Magazine, v 41, n 9, September, 2003, p 82-89
5. A. Soldo, A. Gopalan, P.R. Mukund & M. Margala, "Current sensor for on-chip non-intrusive testing of R.F systems", Proceedings of 17th International conference on VLSI Deign, January 2004, pages: 1023-1027
6. Anand Gopalan, P.R.Mukund and Martin Margala, "A Non-Intrusive Self-Test Methodology for RF CMOS Low Noise Amplifiers", Proceedings of IEEE Mixed Signal Test Workshop 2004, June 23-25 2004, pages 196-202