XPS: A Multi-Channel Preamplifier-ohuper 1C for X-Ray Spectroscopy

IEEE Transactions on Nuclear Science

Volumn 45, Issue 3 PART 1, 1998, Pages 732-734

  Krieger, B ^a,b   Kipnis, ^a   Ludewigt, B A ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); ANALOG TO DIGITAL CONVERSION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC VARIABLES MEASUREMENT; ELECTRONS; INTEGRATED CIRCUIT LAYOUT; SPURIOUS SIGNAL NOISE; X RAY SPECTROMETERS; X RAY SPECTROSCOPY;

DISCRETE SHAPING AMPLIFIER MODULES; VARIABLE GAIN PULSE SHAPING AMPLIFIERS;

CMOS INTEGRATED CIRCUITS;

EID: 0032099860     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.682625     Document Type: Article

References (7)

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