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Nano Letters

Volumn 7, Issue 6, 2007, Pages 1823-1826

Soft lithographic fabrication of high Q polymer microcavity arrays

(3) Armani, Andrea M a Srinivasan, Akil a Vahala, Kerry J a

a CALIFORNIA INSTITUTE OF TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FABRICATION DESIGN; LOW LOSS POLYMERS; MICRODISK RESONATORS; POLYMERIC RESONATORS;

OPTICAL FIBER FABRICATION; OPTICAL RESONATORS; PHOTONIC CRYSTALS; QUALITY CONTROL; ULTRAVIOLET RADIATION;

CAVITY RESONATORS;

NANOMATERIAL; POLYMER;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; GENETIC PROCEDURES; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; TRANSDUCER; ULTRASTRUCTURE; VIBRATION;

BIOSENSING TECHNIQUES; CRYSTALLIZATION; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; POLYMERS; TRANSDUCERS; VIBRATION;

EID: 34547255313 PISSN: 15306984 EISSN: None Source Type: Journal
DOI: 10.1021/nl0708359 Document Type: Article

Times cited : (66)

References (17)

1
- 0042782845
- Chao, C. Y.; Guo, L. J. Appl. Phys. Lett. 2003, 83, 1527-1529.
- (2003) Appl. Phys. Lett , vol.83 , pp. 1527-1529
- Chao, C.Y.¹ Guo, L.J.²

2
- 33846255862
- Takeuchi, H.; Natsume, K.; Suzuki, S.; Sakata, H. Electron. Lett. 2007, 43, 30-32.
- (2007) Electron. Lett , vol.43 , pp. 30-32
- Takeuchi, H.¹ Natsume, K.² Suzuki, S.³ Sakata, H.⁴

3
- 19644401073
- Min, B. K.; Kippenberg, T. J.; Yang, L.; Vahala, K. J.; Kalkman, J.; Polman, A. Phys. Rev. A 2004, 70, 033803.
- (2004) Phys. Rev. A , vol.70 , pp. 033803
- Min, B.K.¹ Kippenberg, T.J.² Yang, L.³ Vahala, K.J.⁴ Kalkman, J.⁵ Polman, A.⁶

4
- 1642619459
- Martin, A. L.; Armani, D. K.; Yang, L.; Vahala, K. J. Opt. Lett. 2004, 29, 533-535.
- (2004) Opt. Lett , vol.29 , pp. 533-535
- Martin, A.L.¹ Armani, D.K.² Yang, L.³ Vahala, K.J.⁴

5
- 0036875283
- Rabiei, P.; Steier, W. H.; Zhang, C.; Dalton, L. R. J. Lightwave Technol. 2002, 20, 1968-1975.
- (2002) J. Lightwave Technol , vol.20 , pp. 1968-1975
- Rabiei, P.¹ Steier, W.H.² Zhang, C.³ Dalton, L.R.⁴

6
- 0001366258
- Gorodetsky, M. L.; Savchenkov, A. A.; Ilchenko, V. S. Opt. Lett. 1996, 21, 453-455.
- (1996) Opt. Lett , vol.21 , pp. 453-455
- Gorodetsky, M.L.¹ Savchenkov, A.A.² Ilchenko, V.S.³

7
- 0037468209
- Armani, D. K.; Kippenberg, T. J.; Spillane, S. M.; Vahala, K. J. Nature 2003, 421, 925-928.
- (2003) Nature , vol.421 , pp. 925-928
- Armani, D.K.¹ Kippenberg, T.J.² Spillane, S.M.³ Vahala, K.J.⁴

8
- 0001291165
- Vernooy, D. W.; Ilchenko, V, S.; Mabuchi, H.; Streed, E. W.; Kimble, H. J. Opt. Lett. 1998, 23, 247-249.
- (1998) Opt. Lett , vol.23 , pp. 247-249
- Vernooy, D.W.¹ Ilchenko, V.S.² Mabuchi, H.³ Streed, E.W.⁴ Kimble, H.J.⁵

9
- 0033876850
- Jo, B. H.; Van Lerberghe, L. M.; Motsegood, K. M.; Beebe, D. J. J. Microelectromech. Syst. 2000, 9, 76-81.
- (2000) J. Microelectromech. Syst , vol.9 , pp. 76-81
- Jo, B.H.¹ Van Lerberghe, L.M.² Motsegood, K.M.³ Beebe, D.J.⁴

10
- 8944257381
- Xia, Y. N.; Kim, E.; Zhao, X. M.; Rogers, J. A.; Prentiss, M.; Whitesides, G. M. Science 1996, 273, 347-349.
- (1996) Science , vol.273 , pp. 347-349
- Xia, Y.N.¹ Kim, E.² Zhao, X.M.³ Rogers, J.A.⁴ Prentiss, M.⁵ Whitesides, G.M.⁶

11
- 0034227547
- Cai, M.; Painter, O.; Vahala, K. J. Phys. Rev. Lett. 2000, 85, 74-77.
- (2000) Phys. Rev. Lett , vol.85 , pp. 74-77
- Cai, M.¹ Painter, O.² Vahala, K.J.³

12
- 3442883790
- Spillane, S. M.; Kippenberg, T. J.; Painter, O. J.; Vahala, K. J. Phys. Rev. Lett. 2003, 91, 043902.
- (2003) J. Phys. Rev. Lett , vol.91 , pp. 043902
- Spillane, S.M.¹ Kippenberg, T.J.² Painter, O.J.³ Vahala, K.⁴

13
- 33644891357
- Poon, J. K. S.; Zhu, L.; DeRose, G. A.; Yariv, A. Opt. Lett. 2006, 31, 456-458.
- (2006) Opt. Lett , vol.31 , pp. 456-458
- Poon, J.K.S.¹ Zhu, L.² DeRose, G.A.³ Yariv, A.⁴

14
- 0036883172
- Chao, C. Y.; Guo, L. J. J. Vac. Sci. Technol., B 2002, 20, 2862-2866.
- (2002) J. Vac. Sci. Technol., B , vol.20 , pp. 2862-2866
- Chao, C.Y.¹ Guo, L.J.²

15
- 0042879734
- Yang, L.; Armani, D. K.; Vahala, K. J. Appl. Phys. Lett. 2003, 83, 825-826.
- (2003) Appl. Phys. Lett , vol.83 , pp. 825-826
- Yang, L.¹ Armani, D.K.² Vahala, K.J.³

16
- 33750714414
- Li, Z. Y.; Zhang, Z. Y.; Scherer, A.; Psaltis, D. Opt. Express 2006, 14 (22), 10494-10499.
- (2006) Opt. Express , vol.14 , Issue.22 , pp. 10494-10499
- Li, Z.Y.¹ Zhang, Z.Y.² Scherer, A.³ Psaltis, D.⁴

17
- 84858101866
- In prior work, it has been shown that the smoothness of the replicated resonator surface is sufficient to enable material-loss-dominated Q factors when the intrinsic Q (Q0) is in excess of 1 million. Therefore, in order to solve for the material absorption, the intrinsic Q must be determined. The intrinsic modal line width (and Q0) was computed using a simple coupling model to analyze the loaded transmission spectra. The material absorption was then calculated using the relation α, 2π.n eff/λQ where α is the material absorption, n eff is the effective refractive index of the material determined from the free-spectral-range, and λ is the wavelength of the resonance. The effective refractive index (neff) of the microresonator was determined from the free-spectral range. The principal transmission minima were identified by performing a broad-band transmission spectrum measurement; the exact location of ea
- eff = 1.48; however, in the near-IR, the effective refractive indices of the two polymers changed to 1.33 and 1.38 respectively.

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