Investigation of ice-solid interfaces by force microscopy: Plastic flow and adhesive forces

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 16, Issue 3, 1998, Pages 1832-1837

  Pittenger, Bede ^a   Cook, Debra J ^a   Slaughterbeck, Clifford R ^a,b   Fain Jr , Samuel C ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

^b Microstar Laboratories   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE FORCE; APPLIED FORCES; ATOMIC FORCE MICROSCOPES; FORCE CURVE; FORCE MICROSCOPY; ICE SURFACES; IN-BETWEEN; INDENTATION DEPTH; MACROSCOPIC MEASUREMENTS; OXIDIZED SILICON; PULL-OFF FORCES; PURE WATER; SOLID INTERFACES; TIME-SCALES; YIELD STRENGTH;

ICE; PLASTIC FLOW; SILICON OXIDES; WATER VAPOR;

PHASE INTERFACES;

EID: 34547254460     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581483     Document Type: Article

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