Electric field effects on force curves for oxidized silicon tips and ice surfaces in a controlled environment

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 14, Issue 3, 1996, Pages 1213-1218

  Slaughterbeck, C R ^a   Kukes, E W ^a   Pittenger, B ^a   Cook, D J ^a   Williams, P C ^a   Eden, V L ^a   Fain Jr , S C ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001506277     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580269     Document Type: Article

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