High-resolution measurement of resonant wave patterns by perturbing the evanescent field using a nanosized probe in a transmission scanning near-field optical microscopy configuration

Journal of Lightwave Technology

Volumn 25, Issue 7, 2007, Pages 1811-1818

  Hopman, Wico C L ^a   Stoffer, Remco ^a   de Ridder, René M ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Atomic force microscopy (AFM); Integrated optics; Modeling; Near field microscopy; Optical microcavities; Optical signal detection; Photonic crystal (PhC); Silicon on insulator (SOI)

Indexed keywords

ATOMIC FORCE MICROSCOPY; INTEGRATED OPTICS; MICROCAVITIES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL MICROSCOPY; OPTICAL SIGNAL PROCESSING; PHOTONIC CRYSTALS; SIGNAL DETECTION;

PROBE-INDUCED CHANGE; RESONANCE WAVELENGTH;

SILICON ON INSULATOR TECHNOLOGY;

EID: 34547215935     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2007.897693     Document Type: Article

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