Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance

Optics Express

Volumn 14, Issue 19, 2006, Pages 8745-8752

  Hopman, W C L ^a   Hollink, A J F ^a   De Ridder, R M ^a   Van Der Werf, K O ^a   Subramaniam, V ^a   Bogaerts, W ^b  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; MICROOPTICS; NANOTECHNOLOGY; Q FACTOR MEASUREMENT; SILICON; TUNING;

MICROCAVITY RESONANCE; NANOMECHANICAL TUNING; PHOTONIC CRYSTAL; WAVELENGTH;

OPTICAL RESONATORS;

EID: 33748946226     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.008745     Document Type: Article

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