Dielectric functions and critical points of PbTi O3, PbZr O3, and Pb Zr0.57 Ti0.43 O3 grown on SrTi O3 substrate

Applied Physics Letters

Volumn 91, Issue 2, 2007, Pages

  Kang, T D ^a   Lee, Hosun ^a   Xing, G ^b   Izumskaya, N ^b   Avrutin, V ^b   Xiao, B ^b   Morko H ^b  

^a Kyung Hee University   (South Korea)

^b Virginia Commonwealth University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; FILM GROWTH; MOLECULAR BEAM EPITAXY; SINGLE CRYSTALS; SPECTROSCOPIC ELLIPSOMETRY; SPUTTERING;

CRITICAL POINT ENERGIES; CRITICAL POINT MODEL; DIELECTRIC FUNCTIONS; INTRINSIC ALLOY DISORDER;

THIN FILMS;

EID: 34547178784     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2756168     Document Type: Article

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