Bilayer thickness effects on nanoindentation behavior of Ag/Ni multilayers

Scripta Materialia

Volumn 57, Issue 8, 2007, Pages 703-706

  Kang, Bong C ^a   Kim, Hee Y ^a   Kwon, Oh Y ^a   Hong, Soon H ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Hall Petch relationship; Hardness; Multilayer thin films; Nanoindentation; Sputtering

Indexed keywords

CREEP TESTING; GRAIN BOUNDARIES; NANOINDENTATION; NICKEL; SILVER COMPOUNDS;

BILAYER THICKNESS; HALL-PETCH RELATIONSHIP; MECHANICAL BEHAVIOR; MULTILAYER THIN FILMS;

MULTILAYERS;

EID: 34547138133     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2007.06.038     Document Type: Article

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