Phototransformation of C 60 thin films by uv pulsed laser irradiation: Comparative photoacoustic, AFM, and Raman studies

Journal of Nanoscience and Nanotechnology

Volumn 7, Issue 4-5, 2007, Pages 1414-1418

  Alvarez Zauco, E ^a   Basiuk, E V ^a   Castaneda Guzman R ^a   Sato Berru R Y ^a   Saniger Blesa, J M ^a   Villagran Muniz M ^a   Banuelos J G ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

Fullerene; Laser; Photoacoustic; Polymerization; Raman; Thin films

Indexed keywords

PHOTOTRANSFORMATION;

FULLERENES;

FULLERENE C60; FULLERENE DERIVATIVE; POLYMER; UNCLASSIFIED DRUG;

ACOUSTICS; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; COMPARATIVE STUDY; LASER; LIGHT; METHODOLOGY; NANOTECHNOLOGY; PHOTOCHEMISTRY; RADIATION SCATTERING; RAMAN SPECTROMETRY; SURFACE PROPERTY; THERMODYNAMICS; TIME; ULTRAVIOLET RADIATION;

ACOUSTICS; FULLERENES; LASERS; LIGHT; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; PHOTOCHEMISTRY; POLYMERS; SCATTERING, RADIATION; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES; THERMODYNAMICS; TIME FACTORS; ULTRAVIOLET RAYS;

EID: 34447526774     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2007.322     Document Type: Article

References (21)

1. Y. Li, J. H. Rhee, D. Singh, and S. C. Sharma, Mat. Res. Soc. Symp. Proc. 734, B9.31 (2003).
2. J. H. Rhee, D. Singh, Y. Li, and S. C. Sharma, Solid Slate Commun. 127, 295 (2003).
3. A. V. Talzin, L. S. Dubrovinsky, T. Le Bihan, and U. Janssson, Phys. Rev. B 65, 245413 (2002).
4. Y. B. Zhao, D. M. Poirier, R. J. Pcchman, and J. H. Weaver, Appl. Phys. Lett. 64, 5 (1994).
5. A. Yogo, T. Majima, and A. Itoh, Nucl. Instr. Meth. Phys. Res. B 193, 209 (2002)
6. A. M. Rao, Ping Zhou, Kai-An Wang, G. T. Hager, J. M. Holden, Ying Wang, W.-T. Lee, Xiang-Xin Bi, P. C. Ekiund, D. S. Cornctt, M. A. Duncan, and I. J. Amsler, Science 259, 995 (1993).
7. V. A. Karachevtsev, O. M. Vork, A. M. Plochotnichenko, and A. V. Peschanskii, Am. Inst. Phys. 17 (2002).
8. R. Käsmair, S. Lätsch, and H. Hiraoka, Appl. Phys. A 63, 305 (1996).
9. G. Z. Li, J. Mater. Sci. 38, 921 (2003).
10. U. Zhokhavets, R. Goldhahn, G. Gobsch, M. Al-lbrahim, Hans-Klaus Roth, S. Sensfuss, E. Klemm, and D. A. M. Egbe, Thin Solid Films 444, 215 (2003).
11. A. M. Rao, P. C. Ekiund, J.-L. Hodeau, L. Marques, and M. Nuñez.Regueiro, Phys. Rev. B 55, 4766 (1997).
12. V. A. Davidv, L. S. Kashevarova, and A. V. Rakhmanina, J. Phys. Chem. B 103, 1800 (1999).
13. Y, Iwasa. T. Arima, R. M. Fleming, T. Siegrist, O. Zhou, R. C. Haddon, L. J. Rothberg, K. B. Lyons, H. L. Carter, Jr., A. F. Hebard, R. Tycko, G. Dabbagh, J. J. Krajewski, G. A. Tomas, and T. Yagi, Science 264, 1570 (1994).
14. A. Hassanien, J. Gasperic, J. Demsar, I. Musevic, and D. Mihailovic, Appl. Phys. Lett. 70, 4 (1997).
15. B. Burger, J. Winter, and H. Kusmany Phys. B 101, 227 (1996).
16. E. Alvarez Zauco, H. Sobral, E. V. Basiuk, (GolovatayaDzhymbeeva), J. M. Saniger-Blesa, and M. Villagrán-Muniz, Appl. Surf. Sci. 248, 243 (2005).
17. J. L. Pineda, R. Caslañeda-Guzmán, M. Villagran, and A. Huanosta, Appl. Phys. Lett. 79, 1166 (2001).
18. P. C. Eklund, A. M. Rao, Ping Zhou, Ying Wang, and J. M. Holden, Thin Solid Films 257, 185 (1995).
19. R. Govinthasamy, J. H. Rhee, and S. C. Sharma, Mat. Res. Soc. Symp. Proc. 734, B9, 30 (2003).
20. H. Kusmany, R. Pfeiffer, M. Hulman, and, C. Krcmberger, Phil. Trans. R. Soc. Lond. A 04TA2406 (2004).
21. A. C. Ferrari and J. Robertson, Phys. Rev. B 61, 20 (2000).