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Volumn 122, Issue 1-4, 2006, Pages 116-120

Simulation of light ion induced DNA damage patterns

Author keywords

[No Author keywords available]

Indexed keywords

DOUBLE STRANDED DNA; HELIUM; DNA; ION;

EID: 34347405129     PISSN: 01448420     EISSN: None     Source Type: Journal    
DOI: 10.1093/rpd/ncl451     Document Type: Article
Times cited : (49)

References (18)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.