-
1
-
-
0037197449
-
Electrical properties of SiC: characterisation of bulk crystals and epilayers
-
Irmscher K. Electrical properties of SiC: characterisation of bulk crystals and epilayers. Mater. Sci. Eng. B 91/92 (2002) 358-366
-
(2002)
Mater. Sci. Eng. B
, vol.91-92
, pp. 358-366
-
-
Irmscher, K.1
-
2
-
-
0037410803
-
Thermal conductivity of liquid phase sintered silicon carbide
-
Sigl L.S. Thermal conductivity of liquid phase sintered silicon carbide. J. Eur. Ceram. Soc. 23 7 (2003) 1115-1122
-
(2003)
J. Eur. Ceram. Soc.
, vol.23
, Issue.7
, pp. 1115-1122
-
-
Sigl, L.S.1
-
3
-
-
0009460210
-
Melting points, crystallographic transformation and thermodynamic values
-
Schneider Jr. S.J. (Ed), ASM International
-
Schlesinger M.E. Melting points, crystallographic transformation and thermodynamic values. In: Schneider Jr. S.J. (Ed). Engineered Materials Handbook Vol. 4 (1991), ASM International 883-891
-
(1991)
Engineered Materials Handbook
, vol.4
, pp. 883-891
-
-
Schlesinger, M.E.1
-
4
-
-
0035413132
-
Microstructural evolution in liquid-phase-sintered SiC. I. Effect of starting SiC powder
-
Xu H., Bhatia T., Deshpande S.A., Padture N.P., Ortiz A.L., and Cumbrera F.L. Microstructural evolution in liquid-phase-sintered SiC. I. Effect of starting SiC powder. J. Am. Ceram. Soc. 84 7 (2001) 1578-1584
-
(2001)
J. Am. Ceram. Soc.
, vol.84
, Issue.7
, pp. 1578-1584
-
-
Xu, H.1
Bhatia, T.2
Deshpande, S.A.3
Padture, N.P.4
Ortiz, A.L.5
Cumbrera, F.L.6
-
5
-
-
0035413155
-
Microstructural evolution in liquid-phase-sintered SiC. Part II. Effects of planar defects and seeds in the starting powder
-
Deshpande S.A., Bhatia T., Xu H., Padture N.P., Ortiz A.L., and Cumbrera F.L. Microstructural evolution in liquid-phase-sintered SiC. Part II. Effects of planar defects and seeds in the starting powder. J. Am. Ceram. Soc. 84 7 (2001) 1585-1590
-
(2001)
J. Am. Ceram. Soc.
, vol.84
, Issue.7
, pp. 1585-1590
-
-
Deshpande, S.A.1
Bhatia, T.2
Xu, H.3
Padture, N.P.4
Ortiz, A.L.5
Cumbrera, F.L.6
-
6
-
-
0036647165
-
Microstructural evolution in liquid-phase-sintered SiC. Part III. Effect of nitrogen-gas sintering atmosphere
-
Ortiz A.L., Bhatia T., Padture N.P., and Pezzotti G. Microstructural evolution in liquid-phase-sintered SiC. Part III. Effect of nitrogen-gas sintering atmosphere. J. Am. Ceram. Soc. 85 7 (2002) 1835-1840
-
(2002)
J. Am. Ceram. Soc.
, vol.85
, Issue.7
, pp. 1835-1840
-
-
Ortiz, A.L.1
Bhatia, T.2
Padture, N.P.3
Pezzotti, G.4
-
7
-
-
33745590893
-
The influence of porosity on the electrical properties of liquid-phase-sintered silicon carbide
-
Ihle J., Martin H.-P., Herrmann M., Obenaus P., Adler J., Hermel W., et al. The influence of porosity on the electrical properties of liquid-phase-sintered silicon carbide. Int. J. Mater. Res. 97 5 (2006) 649-656
-
(2006)
Int. J. Mater. Res.
, vol.97
, Issue.5
, pp. 649-656
-
-
Ihle, J.1
Martin, H.-P.2
Herrmann, M.3
Obenaus, P.4
Adler, J.5
Hermel, W.6
-
8
-
-
33750969652
-
Relationships between microstructure and electrical properties of liquid-phase-sintered silicon carbide materials using impedance spectroscopy
-
Can A., McLachlan D.S., Sauti G., and Herrmann M. Relationships between microstructure and electrical properties of liquid-phase-sintered silicon carbide materials using impedance spectroscopy. J. Eur. Ceram. Soc. 27 2/3 (2005) 1361-1363
-
(2005)
J. Eur. Ceram. Soc.
, vol.27
, Issue.2-3
, pp. 1361-1363
-
-
Can, A.1
McLachlan, D.S.2
Sauti, G.3
Herrmann, M.4
-
9
-
-
0034893838
-
Electrical and thermal conductivity of liquid phase sintered SiC
-
Volz E., Roosen A., Hartung W., and Winnacker A. Electrical and thermal conductivity of liquid phase sintered SiC. J. Eur. Ceram. Soc. 21 10/11 (2001) 2089-2093
-
(2001)
J. Eur. Ceram. Soc.
, vol.21
, Issue.10-11
, pp. 2089-2093
-
-
Volz, E.1
Roosen, A.2
Hartung, W.3
Winnacker, A.4
-
10
-
-
0242413070
-
Interface characteristics affecting electrical properties of Y-doped SiC
-
Siegelin F., Kleebe H.-J., and Sigl L.S. Interface characteristics affecting electrical properties of Y-doped SiC. J. Mater. Res. 18 11 (2003) 2608-2617
-
(2003)
J. Mater. Res.
, vol.18
, Issue.11
, pp. 2608-2617
-
-
Siegelin, F.1
Kleebe, H.-J.2
Sigl, L.S.3
-
11
-
-
0345411831
-
Schottky barrier formation in liquid-phase-sintered silicon carbide
-
Kleebe H.-J., and Siegelin F. Schottky barrier formation in liquid-phase-sintered silicon carbide. Z. Metallkd. 94 3 (2003) 211-217
-
(2003)
Z. Metallkd.
, vol.94
, Issue.3
, pp. 211-217
-
-
Kleebe, H.-J.1
Siegelin, F.2
-
12
-
-
0034274218
-
Quantitative phase-composition analysis of liquid-phase-sintered silicon carbide using the Rietveld method
-
Ortiz A.L., Cumbrera F.L., Sánchez-Bajo F., Guiberteau F., Xu H., and Padture N.P. Quantitative phase-composition analysis of liquid-phase-sintered silicon carbide using the Rietveld method. J. Am. Ceram. Soc. 83 9 (2000) 2282-2286
-
(2000)
J. Am. Ceram. Soc.
, vol.83
, Issue.9
, pp. 2282-2286
-
-
Ortiz, A.L.1
Cumbrera, F.L.2
Sánchez-Bajo, F.3
Guiberteau, F.4
Xu, H.5
Padture, N.P.6
-
13
-
-
0035369844
-
X-ray powder diffraction analysis of a silicon carbide-based ceramic
-
Ortiz A.L., Sánchez-Bajo F., Cumbrera F.L., and Guiberteau F. X-ray powder diffraction analysis of a silicon carbide-based ceramic. Mater. Lett. 49 2 (2001) 137-145
-
(2001)
Mater. Lett.
, vol.49
, Issue.2
, pp. 137-145
-
-
Ortiz, A.L.1
Sánchez-Bajo, F.2
Cumbrera, F.L.3
Guiberteau, F.4
-
14
-
-
34347345143
-
Impedance spectroscopy of liquid-phase sintered silicon carbide
-
Thompson D.O., and Chimenti D.E. (Eds), American Institute of Physics
-
McLachlan D.S., Sauti G., Vorster A., and Hermann M. Impedance spectroscopy of liquid-phase sintered silicon carbide. In: Thompson D.O., and Chimenti D.E. (Eds). Review of Quantitative Nondestructive Evaluation Vol. 23 (2004), American Institute of Physics 1122-1128
-
(2004)
Review of Quantitative Nondestructive Evaluation
, vol.23
, pp. 1122-1128
-
-
McLachlan, D.S.1
Sauti, G.2
Vorster, A.3
Hermann, M.4
-
15
-
-
84889995833
-
Application of impedance spectroscopy
-
Barsoukov E., and Ross J. (Eds), Wiley-Interscience
-
Bonanos N., Steele B.C.H., and Butler E.P. Application of impedance spectroscopy. In: Barsoukov E., and Ross J. (Eds). Impedance Spectroscopy. Theory, Experiment, and Applications. 2nd ed. (2005), Wiley-Interscience 205-537
-
(2005)
Impedance Spectroscopy. Theory, Experiment, and Applications. 2nd ed.
, pp. 205-537
-
-
Bonanos, N.1
Steele, B.C.H.2
Butler, E.P.3
-
16
-
-
0013277785
-
SiC technology
-
Chen W.-K. (Ed), CRC Press and IEEE Press, Boca Raton, Florida
-
Neudeck P.G. SiC technology. In: Chen W.-K. (Ed). The VLSI Handbook, The Electrical Engineering Handbook Series (2000), CRC Press and IEEE Press, Boca Raton, Florida 61-624
-
(2000)
The VLSI Handbook, The Electrical Engineering Handbook Series
, pp. 61-624
-
-
Neudeck, P.G.1
-
17
-
-
0027552344
-
Core/rim structure of liquid-phase-sintered silicon carbide
-
Sigl L.S., and Kleebe H.-J. Core/rim structure of liquid-phase-sintered silicon carbide. J. Am. Ceram. Soc. 76 3 (1993) 773-776
-
(1993)
J. Am. Ceram. Soc.
, vol.76
, Issue.3
, pp. 773-776
-
-
Sigl, L.S.1
Kleebe, H.-J.2
-
18
-
-
0036479258
-
Microstructural analysis of liquid-phase-sintered β-silicon carbide
-
Zhan G.-D., Ikuhara Y., Mitomo M., Xie R.-J., Sakuma T., and Mukherjee A.K. Microstructural analysis of liquid-phase-sintered β-silicon carbide. J. Am. Ceram. Soc. 85 2 (2002) 430-436
-
(2002)
J. Am. Ceram. Soc.
, vol.85
, Issue.2
, pp. 430-436
-
-
Zhan, G.-D.1
Ikuhara, Y.2
Mitomo, M.3
Xie, R.-J.4
Sakuma, T.5
Mukherjee, A.K.6
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