메뉴 건너뛰기




Volumn 27, Issue 13-15, 2007, Pages 3935-3939

Complex impedance spectroscopy study of a liquid-phase-sintered α-SiC ceramic

Author keywords

Electrical properties; Impedance spectroscopy; Liquid phase sintering; SiC

Indexed keywords

ACTIVATION ENERGY; ELECTRIC CONDUCTIVITY; ELECTRIC IMPEDANCE; LIQUID PHASE SINTERING; SILICON CARBIDE; THERMAL EFFECTS;

EID: 34347341672     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2007.02.066     Document Type: Article
Times cited : (24)

References (18)
  • 1
    • 0037197449 scopus 로고    scopus 로고
    • Electrical properties of SiC: characterisation of bulk crystals and epilayers
    • Irmscher K. Electrical properties of SiC: characterisation of bulk crystals and epilayers. Mater. Sci. Eng. B 91/92 (2002) 358-366
    • (2002) Mater. Sci. Eng. B , vol.91-92 , pp. 358-366
    • Irmscher, K.1
  • 2
    • 0037410803 scopus 로고    scopus 로고
    • Thermal conductivity of liquid phase sintered silicon carbide
    • Sigl L.S. Thermal conductivity of liquid phase sintered silicon carbide. J. Eur. Ceram. Soc. 23 7 (2003) 1115-1122
    • (2003) J. Eur. Ceram. Soc. , vol.23 , Issue.7 , pp. 1115-1122
    • Sigl, L.S.1
  • 3
    • 0009460210 scopus 로고
    • Melting points, crystallographic transformation and thermodynamic values
    • Schneider Jr. S.J. (Ed), ASM International
    • Schlesinger M.E. Melting points, crystallographic transformation and thermodynamic values. In: Schneider Jr. S.J. (Ed). Engineered Materials Handbook Vol. 4 (1991), ASM International 883-891
    • (1991) Engineered Materials Handbook , vol.4 , pp. 883-891
    • Schlesinger, M.E.1
  • 4
    • 0035413132 scopus 로고    scopus 로고
    • Microstructural evolution in liquid-phase-sintered SiC. I. Effect of starting SiC powder
    • Xu H., Bhatia T., Deshpande S.A., Padture N.P., Ortiz A.L., and Cumbrera F.L. Microstructural evolution in liquid-phase-sintered SiC. I. Effect of starting SiC powder. J. Am. Ceram. Soc. 84 7 (2001) 1578-1584
    • (2001) J. Am. Ceram. Soc. , vol.84 , Issue.7 , pp. 1578-1584
    • Xu, H.1    Bhatia, T.2    Deshpande, S.A.3    Padture, N.P.4    Ortiz, A.L.5    Cumbrera, F.L.6
  • 5
    • 0035413155 scopus 로고    scopus 로고
    • Microstructural evolution in liquid-phase-sintered SiC. Part II. Effects of planar defects and seeds in the starting powder
    • Deshpande S.A., Bhatia T., Xu H., Padture N.P., Ortiz A.L., and Cumbrera F.L. Microstructural evolution in liquid-phase-sintered SiC. Part II. Effects of planar defects and seeds in the starting powder. J. Am. Ceram. Soc. 84 7 (2001) 1585-1590
    • (2001) J. Am. Ceram. Soc. , vol.84 , Issue.7 , pp. 1585-1590
    • Deshpande, S.A.1    Bhatia, T.2    Xu, H.3    Padture, N.P.4    Ortiz, A.L.5    Cumbrera, F.L.6
  • 6
    • 0036647165 scopus 로고    scopus 로고
    • Microstructural evolution in liquid-phase-sintered SiC. Part III. Effect of nitrogen-gas sintering atmosphere
    • Ortiz A.L., Bhatia T., Padture N.P., and Pezzotti G. Microstructural evolution in liquid-phase-sintered SiC. Part III. Effect of nitrogen-gas sintering atmosphere. J. Am. Ceram. Soc. 85 7 (2002) 1835-1840
    • (2002) J. Am. Ceram. Soc. , vol.85 , Issue.7 , pp. 1835-1840
    • Ortiz, A.L.1    Bhatia, T.2    Padture, N.P.3    Pezzotti, G.4
  • 7
    • 33745590893 scopus 로고    scopus 로고
    • The influence of porosity on the electrical properties of liquid-phase-sintered silicon carbide
    • Ihle J., Martin H.-P., Herrmann M., Obenaus P., Adler J., Hermel W., et al. The influence of porosity on the electrical properties of liquid-phase-sintered silicon carbide. Int. J. Mater. Res. 97 5 (2006) 649-656
    • (2006) Int. J. Mater. Res. , vol.97 , Issue.5 , pp. 649-656
    • Ihle, J.1    Martin, H.-P.2    Herrmann, M.3    Obenaus, P.4    Adler, J.5    Hermel, W.6
  • 8
    • 33750969652 scopus 로고    scopus 로고
    • Relationships between microstructure and electrical properties of liquid-phase-sintered silicon carbide materials using impedance spectroscopy
    • Can A., McLachlan D.S., Sauti G., and Herrmann M. Relationships between microstructure and electrical properties of liquid-phase-sintered silicon carbide materials using impedance spectroscopy. J. Eur. Ceram. Soc. 27 2/3 (2005) 1361-1363
    • (2005) J. Eur. Ceram. Soc. , vol.27 , Issue.2-3 , pp. 1361-1363
    • Can, A.1    McLachlan, D.S.2    Sauti, G.3    Herrmann, M.4
  • 9
    • 0034893838 scopus 로고    scopus 로고
    • Electrical and thermal conductivity of liquid phase sintered SiC
    • Volz E., Roosen A., Hartung W., and Winnacker A. Electrical and thermal conductivity of liquid phase sintered SiC. J. Eur. Ceram. Soc. 21 10/11 (2001) 2089-2093
    • (2001) J. Eur. Ceram. Soc. , vol.21 , Issue.10-11 , pp. 2089-2093
    • Volz, E.1    Roosen, A.2    Hartung, W.3    Winnacker, A.4
  • 10
    • 0242413070 scopus 로고    scopus 로고
    • Interface characteristics affecting electrical properties of Y-doped SiC
    • Siegelin F., Kleebe H.-J., and Sigl L.S. Interface characteristics affecting electrical properties of Y-doped SiC. J. Mater. Res. 18 11 (2003) 2608-2617
    • (2003) J. Mater. Res. , vol.18 , Issue.11 , pp. 2608-2617
    • Siegelin, F.1    Kleebe, H.-J.2    Sigl, L.S.3
  • 11
    • 0345411831 scopus 로고    scopus 로고
    • Schottky barrier formation in liquid-phase-sintered silicon carbide
    • Kleebe H.-J., and Siegelin F. Schottky barrier formation in liquid-phase-sintered silicon carbide. Z. Metallkd. 94 3 (2003) 211-217
    • (2003) Z. Metallkd. , vol.94 , Issue.3 , pp. 211-217
    • Kleebe, H.-J.1    Siegelin, F.2
  • 12
    • 0034274218 scopus 로고    scopus 로고
    • Quantitative phase-composition analysis of liquid-phase-sintered silicon carbide using the Rietveld method
    • Ortiz A.L., Cumbrera F.L., Sánchez-Bajo F., Guiberteau F., Xu H., and Padture N.P. Quantitative phase-composition analysis of liquid-phase-sintered silicon carbide using the Rietveld method. J. Am. Ceram. Soc. 83 9 (2000) 2282-2286
    • (2000) J. Am. Ceram. Soc. , vol.83 , Issue.9 , pp. 2282-2286
    • Ortiz, A.L.1    Cumbrera, F.L.2    Sánchez-Bajo, F.3    Guiberteau, F.4    Xu, H.5    Padture, N.P.6
  • 13
    • 0035369844 scopus 로고    scopus 로고
    • X-ray powder diffraction analysis of a silicon carbide-based ceramic
    • Ortiz A.L., Sánchez-Bajo F., Cumbrera F.L., and Guiberteau F. X-ray powder diffraction analysis of a silicon carbide-based ceramic. Mater. Lett. 49 2 (2001) 137-145
    • (2001) Mater. Lett. , vol.49 , Issue.2 , pp. 137-145
    • Ortiz, A.L.1    Sánchez-Bajo, F.2    Cumbrera, F.L.3    Guiberteau, F.4
  • 14
    • 34347345143 scopus 로고    scopus 로고
    • Impedance spectroscopy of liquid-phase sintered silicon carbide
    • Thompson D.O., and Chimenti D.E. (Eds), American Institute of Physics
    • McLachlan D.S., Sauti G., Vorster A., and Hermann M. Impedance spectroscopy of liquid-phase sintered silicon carbide. In: Thompson D.O., and Chimenti D.E. (Eds). Review of Quantitative Nondestructive Evaluation Vol. 23 (2004), American Institute of Physics 1122-1128
    • (2004) Review of Quantitative Nondestructive Evaluation , vol.23 , pp. 1122-1128
    • McLachlan, D.S.1    Sauti, G.2    Vorster, A.3    Hermann, M.4
  • 17
    • 0027552344 scopus 로고
    • Core/rim structure of liquid-phase-sintered silicon carbide
    • Sigl L.S., and Kleebe H.-J. Core/rim structure of liquid-phase-sintered silicon carbide. J. Am. Ceram. Soc. 76 3 (1993) 773-776
    • (1993) J. Am. Ceram. Soc. , vol.76 , Issue.3 , pp. 773-776
    • Sigl, L.S.1    Kleebe, H.-J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.