Quality assurance challenges in X-ray emission based analyses, the advantage of digital signal processing

Analytical Sciences

Volumn 21, Issue 7, 2005, Pages 737-745

  Papp, T ^a,b   Papp, A T ^a   Maxwell, J A ^a  

^a Cambridge Scientific   (Canada)

^b INSTITUTE OF NUCLEAR RESEARCH ATOMKI   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL SIGNAL PROCESSING; DIGITAL SIGNAL PROCESSORS; ENERGY DISPERSIVE X RAY ANALYSIS; GAMMA RAYS; PILES; QUALITY ASSURANCE; QUALITY CONTROL; SEMICONDUCTOR DETECTORS; SPECTRUM ANALYSIS; X RAY DIFFRACTION ANALYSIS; X RAYS;

COMPARATIVE MEASUREMENTS; DETECTOR RESPONSE; ELECTRONIC EFFICIENCY; NOISE ENVIRONMENTS; RELATIVE INTENSITY; RESPONSE FUNCTIONS; SIGNAL RECOGNITION; SOLID STATE DETECTORS;

X RAY DETECTORS;

EID: 23944438467     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.21.737     Document Type: Review

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