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Volumn 2006, Issue 11614, 2006, Pages 21-26

Evaluating the properties of dielectric materials for microwave integrated circuits

Author keywords

Dielectric; Ferroelectric; Measurement

Indexed keywords

COMPOSITE RESONATORS; PASSIVE MICROWAVE INTEGRATED CIRCUITS; PLANAR CAPACITORS;

EID: 34250901018     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/ic:20060293     Document Type: Conference Paper
Times cited : (1)

References (6)
  • 2
    • 0000195589 scopus 로고    scopus 로고
    • Ferroelectric, Dielectric and Piezoelectric Properties of Ferroelectric Thin Films and Ceramics
    • D. Damjanovic, "Ferroelectric, Dielectric and Piezoelectric Properties of Ferroelectric Thin Films and Ceramics", Rep. Prog, Physics, 61, 1998, pp 1267-1324.
    • (1998) Rep. Prog, Physics , vol.61 , pp. 1267-1324
    • Damjanovic, D.1
  • 4
    • 14044262827 scopus 로고    scopus 로고
    • Techniques for microwave measurements of ferroelectric thin films and their associated error and limitations
    • P. K. Petrov, N. McN Alford and S Gevorgyan, "Techniques for microwave measurements of ferroelectric thin films and their associated error and limitations", Meas. Sci. Technol. 16 2005, pp583-589.
    • (2005) Meas. Sci. Technol , vol.16 , pp. 583-589
    • Petrov, P.K.1    Alford, N.M.2    Gevorgyan, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.