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Volumn , Issue , 2001, Pages
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Extracting the model parametrs of ferroelectric thin film from the experimental characteristics of the capacitance of a planar capacitor
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CAPACITORS;
FERROELECTRIC FILMS;
FERROELECTRIC THIN FILMS;
MICROWAVE DEVICES;
MONTE CARLO METHODS;
BIASING FIELD;
EXPERIMENTAL CHARACTERISTICS;
LOSS TANGENT;
MODEL PARAMETERS;
PHENOMENOLOGICAL MODELING;
PLANAR CAPACITORS;
QUASIRANDOM SEQUENCES;
TUNABLE MICROWAVE DEVICES;
COMPUTER AIDED DESIGN;
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EID: 84897509182
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/EUMA.2001.338942 Document Type: Conference Paper |
Times cited : (1)
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References (5)
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