MnxGe1-x thin layers studied by TEM, X-ray absorption spectroscopy and SQUID magnetometry

Surface Science

Volumn 601, Issue 13, 2007, Pages 2628-2631

  De Padova, P ^a   Ayoub, J P ^b   Berbezier, I ^b   Mariot, J M ^c   Taleb Ibrahimi, A ^d   Richter, M C ^e   Heckmann, O ^e   Testa, A M ^a   Fiorani, D ^a   Olivieri, B ^f   Picozzi, S ^g   Hricovini, K ^e  

^a CNR   (Italy)

^b AIX MARSEILLE UNIVERSITÉ   (France)

^c Université Pierre et Marie Curie   (France)

^d SYNCHROTRON SOLEIL   (France)

^e Université de Cergy Pontoise   (France)

^f INSTITUTE OF ATMOSPHERIC SCIENCES AND CLIMATE   (Italy)

^g UNIVERSITY OF L'AQUILA   (Italy)

Author keywords

Electron microscopy; Electron solid diffraction; Germanium; Magnetic measurements; Manganese; Metal semiconductor interfaces; Soft X ray photoelectron spectroscopy; X ray absorption spectroscopy

Indexed keywords

ELECTRON DIFFRACTION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAGNETIC VARIABLES MEASUREMENT; MANGANESE COMPOUNDS; MOLECULAR BEAM EPITAXY; NANOCRYSTALLITES; SEMICONDUCTOR METAL BOUNDARIES; X RAY ABSORPTION SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON SOLID DIFFRACTION; FERROMAGNETIC BEHAVIOR; METAL SEMICONDUCTOR INTERFACES;

THIN FILMS;

EID: 34250844929     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.11.076     Document Type: Article

References (17)

1. Wolf S.A., Awschalom D.D., Buhrman R.A., Daughton J.M., von Molnár S., Roukes M.L., Chtchelkanova A.Y., and Treger D.M. Science 294 (2001) 1488
2. Dietl T., Ohno H., Matsukura F., Cibert J., and Ferrand D. Science 287 (2000) 1019
3. Park Y.D., Hanbicki A.T., Erwin S.C., Hellberg C.S., Sullivan J.M., Mattson J.E., Ambrose T.F., Wilson A., Spanos G., and Jonker B.T. Science 295 (2002) 651
4. Bihler C., Jaeger C., Vallaitis T., Gjukic M., Brandt M.S., Pippel E., Woltersdorf J., and Gösele U. Appl. Phys. Lett. 88 (2006) 112506
5. Kang J.-S., Kim G., Wi S.C., Lee S.S., Choi S., Cho S., Han S.W., Kim K.H., Song H.J., Shin H.J., Sekiyama A., Kasai S., Suga S., and Min B.I. Phys. Rev. Lett. 94 (2005) 147202
6. Li A.P., Wendelken J.F., Shen J., Feldman L.C., Thompson J.R., and Weitering H.H. Phys. Rev. B 72 (2005) 195205
7. Yamada N., Maeda K., Usami Y., and Ohoyama T. J. Phys. Soc. Jpn. 55 (1986) 3721
8. Cho S., Choi S., Hong S.C., Kim Y., Ketterson J.B., Kim B.-J., Kim Y.C., and Jung J.-H. Phys. Rev. B 66 (2002) 033303
9. Zheng C., Erwin S.C., Feldman L.C., Li A.P., Jin R., Song Y., Thompson J.R., and Weitering H.H. Appl. Phys. Lett. 83 (2003) 5002
10. Edmonds K.W., Fadley N.R.S., Campion R.P., Foxon C.T., Gallagher B.L., Johal T.K., van der Laan G., MacKenzie M., Chapman J.N., and Arenholz E. Appl. Phys. Lett. 84 (2004) 4065
11. Yonamoto Y., Yokoyama T., Amemiya K., Matsumura D., and Ohta T. Phys. Rev. B 63 (2001) 214406
12. Ohldag H., Solinus V., Hillebrecht F.U., Goedkoop J.B., Finazzi M., Matsukura F., and Ohno H. Appl. Phys. Lett. 76 (2000) 2928
13. Picozzi S., Ottaviano L., Passacantando M., Profeta G., Continenza A., Priolo F., Kim M., and Freeman A.J. Appl. Phys. Lett. 86 (2005) 062501
14. Gambardella P., Brune H., Dhesi S.S., Bencok P., Krishnakumar K.S., Gardonio S., Veronese M., Grazioli C., and Carbone C. Phys. Rev. B 72 (2005) 045337
15. De Padova P., Generosi A., Paci B., Rossi Albertini V., Perfetti P., Quaresima C., Olivieri B., Richter M.C., Heckmann O., D'Orazio F., Lucari F., and Hricovini K. Surf. Sci. 600 (2006) 4190
16. Thole B.T., and van der Laan G. Phys. Rev. B 38 (1988) 3158
17. de Groot F.M.F. J. Electron Spectrosc. Relat. Phenom. 67 (1994) 529