A dual-loop scheme for fault-tolerance and early fault detection

IET Control Theory and Applications

Volumn 1, Issue 4, 2007, Pages 925-932

  Chowdhury, F N ^a   Chen, W ^a  

^a University of Louisiana at Lafayette   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CONTROL SYSTEM ANALYSIS; FAULT DETECTION;

DUAL-LOOP SCHEME; LONG-TERM RELIABILITY; SYSTEM PARAMETERS;

FAULT TOLERANCE;

EID: 34250813134     PISSN: 17518644     EISSN: 17518652     Source Type: Journal    
DOI: 10.1049/iet-cta:20060274     Document Type: Article

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