A time-resolved microwave conductivity study of the optoelectronic processes in Ti O2 ∫ In2 S3 ∫ CuIn S2 heterojunctions

Journal of Applied Physics

Volumn 101, Issue 11, 2007, Pages

  Savenije, Tom J ^a   Nanu, Marian ^a   Schoonman, Joop ^a   Goossens, Albert ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER LAYERS; CHARGE CARRIERS; ELECTRIC CONDUCTIVITY; ELECTRIC EXCITATION; ELECTRON TRAPS; MICROWAVES; OPTOELECTRONIC DEVICES; TITANIUM DIOXIDE;

INCIDENT LASER INTENSITY; PHOTOINDUCED CHARGE CARRIERS; SELECTIVE ELECTRONIC EXCITATION; TRIPLE LAYER CONFIGURATION;

HETEROJUNCTIONS;

EID: 34250689180     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2745386     Document Type: Article

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