Crystallization mechanism in Sb:Te thin films

Journal of Physics and Chemistry of Solids

Volumn 68, Issue 5-6, 2007, Pages 883-886

  Prokhorov, E ^a   Gonzalez Hernandez J ^b   Hernandez Landaverde M A ^a   Chao, B ^c   Morales Sanchez E ^d  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

^b CENTRO DE INVESTIGACIÓN EN MATERIALES AVANZADOS   (Mexico)

^c Energy Conversion Devices Inc   (United States)

^d INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

Author keywords

A. Non crystalline materials; B. Vapor deposition; D. Phase transitions

Indexed keywords

AMORPHOUS MATERIALS; CRYSTALLIZATION; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRIC CONDUCTIVITY; PHASE TRANSITIONS; RIETVELD ANALYSIS; X RAY DIFFRACTION;

CRYSTALLINE PHASE; EXOTHERMIC REACTION; FOUR PROBE RESISTIVITY;

THIN FILMS;

EID: 34250310076     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2006.11.034     Document Type: Article

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