Are redox probes a useful indicator of film stability? An electrochemical, AFM and XPS study of electrografted amine films on carbon

Electrochemistry Communications

Volumn 9, Issue 7, 2007, Pages 1456-1462

  Cruickshank, Amy C ^a   Tan, Emelyn S Q ^a   Brooksby, Paula A ^a   Downard, Alison J ^a  

^a UNIVERSITY OF CANTERBURY   (New Zealand)

Author keywords

AFM depth profiling; Amine oxidation; Film permeability; Surface modification

Indexed keywords

ACETONITRILE; AMINES; ATOMIC FORCE MICROSCOPY; CYCLIC VOLTAMMETRY; DEPTH PROFILING; GRAFTING (CHEMICAL); OXIDATION; PHOTORESISTS; SURFACE TREATMENT;

AFM DEPTH PROFILING; AMINE OXIDATION; FILM PERMEABILITY;

THIN FILMS;

EID: 34250210189     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elecom.2007.02.004     Document Type: Article

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