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Volumn 22, Issue 5, 2007, Pages 1193-1199

Local dielectric measurements of BaTiO3-CoFe2O4 nanocomposites through microwave microscopy

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; COBALT COMPOUNDS; CURIE TEMPERATURE; DIELECTRIC PROPERTIES OF SOLIDS; FERROELECTRIC MATERIALS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PERMITTIVITY;

EID: 34250168597     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2007.0174     Document Type: Article
Times cited : (4)

References (19)
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    • Steinhauer, D.E.1    Vlahacos, C.P.2    Wellswood, F.C.3    Anlage, S.M.4
  • 8
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    • Dielectric constant
    • edited by M. Sucher and J. Fox Polytechnic Institute of Brooklyn, Brooklyn, NY
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    • Imtiaz, A.1    Steven, M.2
  • 12
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    • S.M. Anlage, V.V. Talanov, and A.R. Schwartz: Principles of near-field microwave microscopy, section 4.7, in Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, edited by S. Kalinin and A. Gruverman (Springer, New York, 2006), p. 207.
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  • 13
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.