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Volumn 854, Issue , 2004, Pages 196-201
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Sub-critical telephone cord delamination propagation and adhesion measurements
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Author keywords
[No Author keywords available]
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Indexed keywords
ADHESION;
COMPRESSIVE STRESS;
CRACK PROPAGATION;
DELAMINATION;
MEASUREMENT THEORY;
ADHESION MEASUREMENTS;
TELEPHONE CORD DELAMINATION PROPAGATION;
THIN FILM DELAMINATION;
THIN FILMS;
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EID: 34249938626
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-854-u9.5 Document Type: Conference Paper |
Times cited : (4)
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References (16)
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