Fast response of InSb Schottky detector

Review of Scientific Instruments

Volumn 78, Issue 5, 2007, Pages

  Kanno, Ikuo ^a   Hishiki, Shigeomi ^a,b   Kogetsu, Yoshitaka ^a   Nakamura, Tatsuya ^b   Katagiri, Masaki ^b  

^a KYOTO UNIVERSITY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HALL MOBILITY; PARTICLE DETECTORS; SCINTILLATION COUNTERS; SEMICONDUCTING INDIUM COMPOUNDS;

ALPHA PARTICLE DETECTION; INSB WAFERS; SCHOTTKY DETECTORS;

SEMICONDUCTOR DETECTORS;

ANTIMONY; INDIUM;

ALPHA RADIATION; ARTICLE; CHEMISTRY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; RADIATION DOSE; RADIATION EXPOSURE; RADIOMETRY; REPRODUCIBILITY; SEMICONDUCTOR; SENSITIVITY AND SPECIFICITY;

ALPHA PARTICLES; ANTIMONY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INDIUM; RADIATION DOSAGE; RADIOMETRY; REPRODUCIBILITY OF RESULTS; SEMICONDUCTORS; SENSITIVITY AND SPECIFICITY;

EID: 34249936596     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2737768     Document Type: Article

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