Characterization of multiscale surface evolution of polycrystalline copper thin films

Journal of Applied Physics

Volumn 101, Issue 10, 2007, Pages

  Yang, J J ^a   Xu, K W ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER; MAGNETRON SPUTTERING; POLYCRYSTALLINE MATERIALS; POWER SPECTRUM; SURFACE MORPHOLOGY; WAVELET TRANSFORMS;

COPPER THIN FILMS; MULTISCALE SURFACE EVOLUTION; SURFACE FLUCTUATION IMAGE;

THIN FILMS;

EID: 34249915523     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2732440     Document Type: Article

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