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Volumn 2, Issue 1, 2007, Pages 6-8

Bonding of silicon with filled and unfilled polymers based on black silicon

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; DUCTILITY; FLUIDICS; PLASTIC DEFORMATION; PLASTIC TAPES; SILICON WAFERS;

EID: 34249812691     PISSN: None     EISSN: 17500443     Source Type: Journal    
DOI: 10.1049/mnl:20065064     Document Type: Article
Times cited : (18)

References (4)
  • 1
    • 33744530264 scopus 로고    scopus 로고
    • Wafer bonding techniques for microsystem packaging
    • 1742-6588
    • Wei, J.: ' Wafer bonding techniques for microsystem packaging ', J. Phys., Conf. Ser., 2006, 34, p. 943-948 1742-6588
    • (2006) J. Phys., Conf. Ser. , vol.34 , pp. 943-948
    • Wei, J.1
  • 3
    • 0029325460 scopus 로고
    • The black silicon method: A universal method for determining the parameter setting of a fluorine-based reactive ion etcher in deep silicon trench etching with profile control
    • 10.1088/0960-1317/5/2/015 0960-1317
    • Jansen, H., De Boer, M., Legtenberg, R., and Elwenspeok, M.: ' The black silicon method: A universal method for determining the parameter setting of a fluorine-based reactive ion etcher in deep silicon trench etching with profile control ', J. Micromech. Microeng., 1995, 5, p. 115-120 10.1088/0960-1317/5/2/ 015 0960-1317
    • (1995) J. Micromech. Microeng. , vol.5 , pp. 115-120
    • Jansen, H.1    De Boer, M.2    Legtenberg, R.3    Elwenspeok, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.