Temperature evolution of the structural properties of monodomain ferroelectric thin film

Applied Physics Letters

Volumn 90, Issue 19, 2007, Pages

  Janolin, Pierre Eymeric ^a   Le Marrec, Fraņoise ^b   Chevreul, Jacques ^a   Dkhil, Brahim ^a  

^a LABORATOIRE STRUCTURES   (France)

^b Universite de Picardie Jules Verne   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); LATTICE CONSTANTS; LEAD COMPOUNDS; PHASE DIAGRAMS; TEMPERATURE MEASUREMENT; X RAY DIFFRACTION;

MECHANICAL STRAIN; MISFIT STRAIN; ROOM TEMPERATURE; STRUCTURAL EVOLUTION;

FERROELECTRIC THIN FILMS;

EID: 34248365619     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2738060     Document Type: Article

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