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1
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34249095314
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J.C. Lambropoulos, Using the grinding merit function (GMF): what quality of grind you can expect in the shop? Convergence, University of Rochester, Center for Optics Manufacturing Newsletter, 1998.
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2
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0010719233
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Finishing Adv. Ceram. Glasses
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Sabia R., Greenhut V.A., and Pantano C.G. (Eds), The American Ceramic Society, Westerville, OH
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Lambropoulos J.C., Jacobs S.D., and Ruckman J. Finishing Adv. Ceram. Glasses. In: Sabia R., Greenhut V.A., and Pantano C.G. (Eds). Ceramic Transactions vol. 102 (1999), The American Ceramic Society, Westerville, OH 113
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(1999)
Ceramic Transactions
, vol.102
, pp. 113
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Lambropoulos, J.C.1
Jacobs, S.D.2
Ruckman, J.3
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5
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0029195021
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S.D. Jacobs, D. Golini, Y. Hsu, B.E. Puchebner, D. Strafford, Wm.I. Kordonski, I.V. Prokhorov, E. Fess, D. Pietrowski, V.W. Kordonski, in: T. Kasai (Ed.), SPIE 2576: Optical Fabrication and Testing, 1995, p. 372.
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6
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85029811821
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D. Golini, S.D. Jacobs, W. Kordonski, P. Dumas, in: M.A. Ealey et al. (Eds.),SPIE CR67: Advanced Materials for Optics and Precision Structures, 1997, p. 251.
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7
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0033353718
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S.R. Arrasmith, I.A. Kozhinova, L.L. Gregg, A.B. Shorey, H.J. Romanofsky, S.D. Jacobs, D. Golini, W.I. Kordonski, S. Hogan, P. Dumas, in: H.P. Stahl (Ed.), SPIE 3782: Optical Manufacturing and Testing III, 1999, p. 92.
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9
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85088758749
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J.E. DeGroote, A.E. Marino, A.L. Bishop, S.D. Jacobs, Using mechanics and polishing particle properties to model material removal for magnetorheological finishing of optical glasses, Conference CD, Topical Meeting on Optical Fabrication and Testing, 90th OSA Annual Meeting, Rochester, NY, 2006
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10
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34249047211
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J.E. DeGroote, J.P. Wilson, T.M. Pfuntner, S.D. Jacobs, Adding chemistry and glass composition data into a mechanical material-removal model for magnetorheological finishing, Conference CD, Topical Meeting on Optical Fabrication and Testing, 90th OSA Annual Meeting, Rochester, NY, 2006.
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12
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34249048790
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J.D. Lytle, Handbook of Optics, in: M. Bass, et al. (Eds.), vol. II, McGraw-Hill, New York, 1995, p. 34.13.
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13
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34248996763
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J.E. DeGroote, H.J. Romanofsky, I.A. Kozhinova, J. Schoen, S.D. Jacobs, SPIE 5180: Manufacturing and Testing V, in: H.P. Stahl (Ed.), 2004, p. 123.
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14
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34249077136
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note
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All roughness measurements were made on a Zygo NewView 5000 white light optical profiler, Zygo Corp., Middlefield, CT, 06455. The instrument was set for areal mapping over 0.25 mm×0.35 mm; 20xMirau; FDA res: high; 20 μm bipolar scan; Min/Mod: 5
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15
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34249109288
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Commercial MRF machine manufactured by QED Technologies, Inc., 1040 University Ave., Rochester, NY, USA.
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16
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23844522382
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Kozhinova I.A., Romanofsky H.J., Maltsev A., Jacobs S.D., Kordonski W.I., and Gorodkin S.R. Appl. Opt. 44 (2005) 4671
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(2005)
Appl. Opt.
, vol.44
, pp. 4671
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Kozhinova, I.A.1
Romanofsky, H.J.2
Maltsev, A.3
Jacobs, S.D.4
Kordonski, W.I.5
Gorodkin, S.R.6
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17
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3142658708
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R. Hawley-Fedder, P. Geraghty, S. Locke, M. McBurney, M. Runkel, T. Suratwala, S. Thompson, P. Wegner, P. Whitman, in: M.A. Lane, C.R. Wuest (Eds.), SPIE 5341: Optical Engineering at the Lawrence Livermore National Laboratory II-The National Ignition Facility, 2004, p. 121.
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18
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12844273530
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See for example
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See for example. Bagnoud V., Guardalben M.J., Puth J., Zuegel J.D., Mooney T., and Dumas P. Appl. Opt. 44 (2005) 282
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(2005)
Appl. Opt.
, vol.44
, pp. 282
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Bagnoud, V.1
Guardalben, M.J.2
Puth, J.3
Zuegel, J.D.4
Mooney, T.5
Dumas, P.6
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