Comparison of atomic force microscopy and transmission electron microscopy of second-phase particles

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 81, Issue 11, 2001, Pages 2613-2628

  Lagerpusch, Ulrike ^a   Anczykowski, Boris ^a   Nembach, Eckhard ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICA; SOLID SOLUTIONS; TRANSMISSION ELECTRON MICROSCOPY; VOLUME FRACTION;

SECOND-PHASE PARTICLES;

PARTICLE SIZE ANALYSIS;

EID: 0035643365     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610108216658     Document Type: Article

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