Raman scattering characterization of well-aligned RuO2 nanocrystals grown on sapphire substrates

New Journal of Physics

Volumn 9, Issue , 2007, Pages

  Chen, Y M ^a   Korotcov, A ^a   Hsu, H P ^a   Huang, Y S ^a   Tsai, D S ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

INELASTIC SCATTERING; LINEWIDTH; NANOCRYSTALS; RAMAN SCATTERING; RUTHENIUM COMPOUNDS; SUBSTRATES;

MATERIAL SYSTEMS; NANOCRYSTALS GROWTH; SAPPHIRE SUBSTRATES; VIBRATIONAL CHARACTERISTICS;

CRYSTAL GROWTH;

EID: 34249052307     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/9/5/130     Document Type: Article

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