Growth of RuO2 thin layer on Ru(1 0 over(1, ̄) 0) studied by scanning tunneling microscopy

Surface Science

Volumn 601, Issue 11, 2007, Pages 2297-2301

  Zhang, H J ^a   Lu, B ^a   Lu, Y H ^a   Xu, Y F ^a   Li, H Y ^a   Bao, S N ^a   He, P ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Ruthenium oxide thin layer; Ruthenium surface; Scanning tunneling microscopy

Indexed keywords

MOLECULAR STRUCTURE; OXIDATION; PRESSURE EFFECTS; RUTHENIUM COMPOUNDS; SCANNING TUNNELING MICROSCOPY; THERMAL EFFECTS;

OXIDATION RESULTS; REACTION TEMPERATURE; RUTHENIUM OXIDE THIN LAYERS; RUTHENIUM SURFACES;

FILM GROWTH;

EID: 34248999418     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.03.014     Document Type: Article

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