Catalytic activity of the RuO2(100) surface in the oxidation of CO

Journal of Physical Chemistry B

Volumn 108, Issue 38, 2004, Pages 14392-14397

  Knapp, M ^a   Seitsonen, A P ^b   Kim, Y D ^c   Over, H ^a  

^a JUSTUS LIEBIG UNIVERSITY   (Germany)

^b UNIVERSITY OF ZURICH   (Switzerland)

^c UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON MONOXIDE; CATALYST ACTIVITY; ELECTRON ENERGY LOSS SPECTROSCOPY; LOW ENERGY ELECTRON DIFFRACTION; OXIDATION; PROBABILITY DENSITY FUNCTION; SCANNING TUNNELING MICROSCOPY;

DEACTIVATION; DENSITY FUNCTIONAL THEORY (DFT); HIGH-RESOLUTION ENERGY ELECTRON LOSS SPECTROSCOPY (HREELS); TEMPERATURE-PROGRAMMED REACTION (TPR) MEASUREMENTS;

RUTHENIUM COMPOUNDS;

EID: 4944243531     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0497110     Document Type: Article

References (36)

1. Over, H.; Kim, Y. D.; Seitsonen, A. P.; Wendt, S.; Lundgren, E.; Schmid, M.; Varga, P.; Morgante, A.; Ertl, G. Science 2000, 257, 1474.
2. Peden, C. H. F.; Goodman, D. W. J. Phys. Chem. 1986, 90, 1360.
3. Over, H.; Muhler, M. Prog. Surf. Sci. 2003, 72, 3.
4. Kim, Y. D.; Over, H.; Krabbes, G.; Ertl, G. Top. Catal. 2001, 14, 95.
5. Over, H. Appl. Phys. A 2002, 75, 37.
6. Liu, Z.-P.; Hu, P.; Alavi, A. J. Chem. Phys. 2001, 114, 5957.
7. (a) Seitsonen A. P.; Over, H. Ruthenium Dioxide, a Versatile Oxidation Catalyst: First Principles Analysis. In High Performance Computing in Science and Engineering in Munich 2002; Springer-Verlag: Berlin, 2003; pp 171-180.
8. (b) Ari P. Seitsonen: www/iki.fi/~apsi/Science/ movies/.
9. Wendt, S.; Seitsonen, A. P.; Kim, Y. D.; Knapp, M.; Idriss, H.; Over, H. Surf. Sci. 2002, 505, 137.
10. Reuter, K.; Scheffler, M. Phys. Rev. B 2003, 68, 045407.
11. Fan, C. Y.; Wang, J.; Jacobi, K.; Ertl, G. J. Chem. Phys. 2001, 114, 10058.
12. Over, H.; Seitsonen, A. P.; Lundgren, E.; Schmid, M.; Varga, P. J. Am. Chem. Soc. 2001, 123, 11807.
13. Assmann, J.; Löffler, E.; Birkner, A.; Muhler, M. Catal. Today 2003, 85, 235.
14. Kim, Y. D.; Seitsonen, A. P.; Over, H. J. Phys. Chem. B 2001, 105, 2205.
15. Mason, R.; Mills, A.; Milton, D. J. Less Common Met. 1989, 155, 89 and references therein.
16. Assmann, J.; Narkhede, V.; Löffler, E.; Hinrichsen, O.; Over, H.; Muhler, M. J. Phys. Chem., submitted for publication.
17. Lister, T. E.; Tolmachev, Y. V.; Chu, Y.; Cullen, W. G.; You, H.; Yonco, R.; Nagy, Z. J. Electronanal. Chem. 2003, 554, 71.
18. Over, H.; Knapp, M.; Lundgren, E.; Seitsonen, A. P.; Schmid, M.; Varga, P. ChemPhysChem 2004, 5, 10.
19. Bludau, H.; Over, H.; Skottke-Klein, M.; Moritz, W.; Ertl G.; Campbell, C. Phys. Rev. B 1992, 65, 8638.
20. (a) Pendry, J. B. Low Energy Electron Diffraction; Academic Press: London, New York, 1974.
21. (b) Jona, F.; Strozier, J. A., Jr.; Yang, W. S. Rep. Prog. Phys. 1982, 45, 527.
22. (c) Van Hove, M. A.; Weinberg, W. H.; Chan, C.-M. Low Energy Electron Diffraction; Springer: Berlin, Heidelberg, 1986.
23. (d) Heinz, K. Rep. Prog. Phys. 1995, 637.
24. Schwegmann, S.; Seitsonen, A. P.; De Renzi, V.; Dietrich, H.; Bludau, H.; Gierer, M.; Over, H.; Jacobi, K.; Scheffler, M.; Ertl, G. Phys. Rev. B 1998, 57, 15487.
25. Perdew, J. P.; Burke, K.; Ernzerhof, M. Phys. Rev. Lett. 1996, 77, 3365.
26. Troullier, N.; Martins, J. L. Phys. Rev. B 1991, 43, 1993.
27. Lin, W. F.; Zei, M. S.; Kim, Y. D.; Over, H.; Ertl, G. J. Phys. Chem. B 2000, 104, 6040.
28. Kim, Y. D.; Seitsonen, A. P.; Wendt, S.; Wang, J.; Fan, C. Y.; Jacobi, K.; Over, H.; Ertl, G. J. Phys. Chem. B 2001, 105, 3752.
29. Pfnür, H.; P. Feulner, P.; Menzel, D. J. Chem. Phys. 1983, 79, 4613.
30. Kim, Y. D.; Seitsonen, A. P.; Over, H. Surf. Sci. 2000, 465, 1.
31. Knapp, M.; Seitsonen, A. P.; Kim, Y. D.; Over, H. Unpublished LEED analysis.
32. Kim, Y. D.; Seitsonen, A. P.; Over, H. Phys. Rev. B 2001, 63, 115419.
33. Pendry, J. B. J. Phys. C 1980, 13, 937.
34. Gierer, M.; Over, H. Z. Kristallogr. 1999, 214, 14.
35. Over, H.; Seitsonen, A. P. Science 2002, 297, 2003.
36. Assmann, J.; Crihan, D.; Knapp, M.; Lundgren, E.; Löffler, E.; Muhler, M.; Narkhede, V.; Over, H.; Schmid, M.; Varga, P., submitted for publication.