Grazing angle attenuated total reflection spectroscopy: Fields at the interface and source of the enhancement

Applied Spectroscopy

Volumn 61, Issue 5, 2007, Pages 530-536

  Milosevic, Milan ^a   Milosevic, Violet ^b   Berets, S L ^b  

^a MeV Photonics   (United States)

^b Harrick Scientific Products   (United States)

Author keywords

ATR spectroscopy; Attenuated total reflection spectroscopy; Electric field strength; Metal substrate; Monolayers; Sensitivity enhancement; Silicon substrate

Indexed keywords

ATTENUATED TOTAL REFLECTION (ATR) SPECTROSCOPY; ELECTRIC FIELD STRENGTH; METAL SUBSTRATE; SENSITIVITY ENHANCEMENT; SILICON SUBSTRATE;

ELECTRIC FIELD EFFECTS; MONOLAYERS; REFRACTIVE INDEX; SILICON; SPECTROSCOPIC ANALYSIS; SUBSTRATES;

THIN FILMS;

EID: 34248636264     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/000370207780807687     Document Type: Article

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