IR reflection spectra of monolayer films sandwiched between two high refractive index materials

Langmuir

Volumn 20, Issue 16, 2004, Pages 6542-6545

  Lummerstorfer, Thomas ^a   Hoffmann, Helmuth ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ALCOHOLS; ELECTRIC FIELDS; INFRARED SPECTROSCOPY; LIGHT POLARIZATION; MOLECULAR VIBRATIONS; MONOLAYERS; OPTICAL DEVICES; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; SENSITIVITY ANALYSIS; SILICON WAFERS; SINGLE CRYSTALS; SURFACE TREATMENT;

MONOLAYER FILMS; SUBMONOLAYER FILMS; SURFACE VIBRATIONS;

LANGMUIR BLODGETT FILMS;

ALCOHOLS; MONOLAYERS;

EID: 4043162013     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0492916     Document Type: Article

References (26)

1. Griffiths, P. R., Chalmera, J. M., Eds. Handbook of Vibrational Spectroscopy; Wiley: New York, 2002; Vol. 2.
2. Greenler, R. G. J. Chem. Phys. 1966, 44, 310-315.
3. Osawa, M. Top. Appl. Phys. 2001, 81, 163-187.
4. Harrick, N. J. Internal Reflection Spectroscopy, 3rd ed.; Harrick Scientific Company: Ossining, NY, 1987; Chapter 5.
5. Ishino, Y.; Ishida, H. Appl. Spectrosc. 1988, 42, 1296-1302.
6. Olsen, J. E.; Shimura, F. J. Appl. Phys. 1989, 66, 1353-1358.
7. Brendel, R. J. Appl. Phys. 1992, 72, 794-796.
8. Chabal, Y. J.; Hines, M. A.; Feijoo, D. J. Vac. Sci. Technol. 1995, A13, 1719-1727.
9. Khoo, C. G. L.; Ishida, H. Appl. Spectrosc. 1990, 44, 512-518.
10. Rochat, N.; Chabli, A.; Bertin, F.; Olivier, M.; Vergnaud, C.; Mur, P. J. Appl. Phys. 2002, 91, 5029-5034.
11. Milosevic, M.; Berets, S. L.; Fadeev, A. Y. Appl. Spectrosc. 2003, 57, 724-727.
12. Mulcahy, M. E.; Berets, S. L.; Milosevic, M.; Michl, J. J. Phys. Chem. B 2004, 108, 1519-1521.
13. 3), which is of comparable intensity in the nondeuterated octadecanethiol monolayer spectra (see ref 23), is apparently also not observed in ref 12.
14. Kattner, J.; Hoffmann, H. In Handbook of Vibrational Spectroscopy; Griffiths, P. R., Chalmers, J. M., Eds.; Wiley: New York, 2002; Vol. 2, pp 1009-1027.
15. Brunner, H.; Valiant, T.; Mayer, U.; Hoffmann, H. Surf. Sci. 1996, 368, 279-291.
16. Hoffmann, H.; Mayer, U.; Krischanitz, A. Langmuir 1995, 11, 1304-1312.
17. Vallant, T.; Brunner, H.; Mayer, U.; Hoffmann, H.; Leitner, T.; Resch, R.; Friedbacher, G. J. Phys. Chem. B 1998, 102, 7190.
18. Hoffmann, H.; Mayer, U.; Brunner, H.; Krischanitz, A. Vib. Spectrosc. 1995, 8, 151.
19. 2 layer can be used as an internal parameter for the air gap thickness, which can be adjusted to a certain peak height with a reproducibility of <10% by the torque applied to the micrometer screw of the sample holder.
20. Guyot-Sionnest, P.; Superfine, R.; Hunt, J. H.; Shen, Y. R. Chem. Phys. Lett. 1988, 144, 1-5.
21. Tillman, N.; Ulman, A.; Schildkraut, J. S.; Penner, T. L. J. Am. Chem. Soc. 1988, 110, 6136-6144.
22. Allara, D. L.; Parikh, A. N.; Rondolez, F. Langmuir 1995, 11, 2357-2360.
23. Brunner, H.; Mayer, U.; Hoffmann, H. Appl. Spectrosc. 1997, 51, 209-217.
24. Laibinis, P. E.; Whitesides, G. M.; Allara, D. L.; Tao, Y.; Parikh, A. N.; Nuzzo, R. G. J. Am. Chem. Soc. 1991, 113, 7152-7167.
25. Tao, Y. J. Am. Chem. Soc. 1993, 116, 4350-4358.
26. Dubois, L. H.; Nuzzo, R. G. Annu. Rev. Phys. Chem. 1992, 43, 437-463.