Automated 100-position specimen loader and image acquisition system for transmission electron microscopy

Journal of Structural Biology

Volumn 158, Issue 3, 2007, Pages 318-326

  Lefman, Jonathan ^a   Morrison, Robert ^b   Subramaniam, Sriram ^a  

^a NATIONAL CANCER INSTITUTE   (United States)

^b GATAN INC   (United States)

Author keywords

Electron crystallography; High throughput electron microscopy; Nanotechnology; Remote microscopy

Indexed keywords

ARTICLE; AUTOMATION; COMPUTER PROGRAM; IMAGE ANALYSIS; IMAGE DISPLAY; IMAGE ENHANCEMENT; IMAGING SYSTEM; INFORMATION PROCESSING; NANOTECHNOLOGY; PRIORITY JOURNAL; ROOM TEMPERATURE; SCREENING; TRANSMISSION ELECTRON MICROSCOPY;

IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON, TRANSMISSION; SOFTWARE;

EID: 34248594947     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2006.11.007     Document Type: Article

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