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Volumn 311, Issue 2, 2007, Pages 595-608

Electric field induced instabilities in thin confined bilayers

Author keywords

Bilayer; Electric field instability; Interfacial dynamics; Thin film

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; INTERFACES (MATERIALS); LINEAR STABILITY ANALYSIS; NONLINEAR ANALYSIS; SUBSTRATES;

EID: 34248371223     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2007.02.089     Document Type: Article
Times cited : (31)

References (45)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.