Investigations of environmental induced effects on AlQ 3 thin films by AFM phase imaging

Applied Surface Science

Volumn 253, Issue 16, 2007, Pages 6848-6853

  Shukla, Vivek Kumar ^a   Kumar, Satyendra ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

Atomic force microscopy (AFM); Organic light emitting devices (OLEDs); Photoluminescence (PL); Tris(8 hydroxyquinoline)aluminium (AlQ 3 )

Indexed keywords

ALUMINUM COMPOUNDS; ATOMIC FORCE MICROSCOPY; ENVIRONMENTAL IMPACT; IMAGING SYSTEMS; METAL COMPLEXES; ORGANIC LIGHT EMITTING DIODES (OLED); PHOTOLUMINESCENCE;

PHASE IMAGING; TIME CORRELATED SINGLE PHOTON COUNTING (TCSPC) MEASUREMENTS; TRIS(8-HYDROXYQUINOLINE)ALUMINIUM (ALQ3);

THIN FILMS;

EID: 34248353960     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.01.134     Document Type: Article

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