Application of spectroscopic ellipsometry to probe the environmental and photo-oxidative degradation of poly(p-phenylenevinylene) (PPV)

Synthetic Metals

Volumn 139, Issue 3, 2003, Pages 751-753

  Kumar, Satyendra ^a   Biswas, A K ^a   Shukla, V K ^a   Awasthi, A ^a   Anand, R S ^a   Narain, J ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

Degradation; Ellipsometry; Modeling; Poly(p phenylenevinylene)

Indexed keywords

ELLIPSOMETRY; LIGHT ABSORPTION; PHOTOOXIDATION; REFRACTIVE INDEX;

PHOTO-OXIDATIVE DEGRADATION;

ORGANIC POLYMERS;

EID: 0041828317     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(03)00317-5     Document Type: Conference Paper

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