An atomic force microscopic investigation of electro-sensitive polymer surface

Talanta

Volumn 67, Issue 3, 2005, Pages 543-547

  Song, Wenlong ^a   Sun, Taolei ^b   Song, Yanlin ^c   Bai, Yubai ^a   Liu, Fengqi ^a   Jiang, Lei ^b,c  

^a JILIN UNIVERSITY   (China)

^b NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY   (China)

^c INSTITUTE OF CHEMISTRY   (China)

Author keywords

Adhesion force; AFM; Atom transfer radical polymerization; Electro sensitive polymer surface

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; FRICTION; POLYMERIZATION; SENSITIVITY ANALYSIS; SILICON;

ADEHESION FORCE; AFM; ATOM TRANSFER RADICAL POLYMERIZATION; ELECTRO-SENSITIVE POLUMER SURFACE;

POLYMERS;

EID: 24144447021     PISSN: 00399140     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.talanta.2005.06.029     Document Type: Article

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