Trace element AMS at NRL: Initial use of a modified SIMS ion source

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 259, Issue 1, 2007, Pages 27-30

  Grabowski, K S ^a   Knies, D L ^a   Cetina, C ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b NOVA RESEARCH INC   (United States)

Author keywords

Accelerator mass spectrometry; Molecular interference; Secondary ion mass spectrometry; Trace element

Indexed keywords

ION SOURCES; MOLECULAR DYNAMICS; PARTICLE ACCELERATORS; PRECISION BALANCES; SECONDARY ION MASS SPECTROMETRY; TRACE ELEMENTS;

ACCELERATOR MASS SPECTROMETRY; ION ACCELERATORS; MOLECULAR INTERFERENCE; MOLECULAR IONS;

ENGINEERING FACILITIES;

EID: 34248327947     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.01.231     Document Type: Article

References (6)

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3. Knies D.L., Grabowski K.S., Kennedy C.A., Cetina C., Hubler G.K., Tumey S.J., Mignerey A.C., Pohlman J.W., Coffin R.B., and Getaneh M. Nucl. Instr. and Meth. B 223-224 (2004) 72
4. Knies D.L., Grabowski K.S., and Cetina C. Appl. Surf. Sci. 252 (2006) 7297
5. http://www.nasa.gov/genesis.
6. Cetina C., Knies D.L., Grabowski K.S., Getaneh M., Tumey S.J., Raffanti R., Siegmund O.H.W., and Vallerga J.V. Nucl. Instr. and Meth. A 513 (2003) 403