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Volumn 252, Issue 19, 2006, Pages 7297-7300

Implementing a SIMS ion source on the NRL trace element accelerator mass spectrometer

Author keywords

Accelerator mass spectrometry; Molecular interference; Secondary ion mass spectrometry; Trace element

Indexed keywords

ELECTROSTATICS; ION BEAMS; ISOTOPES; MOLECULAR DYNAMICS; SECONDARY ION MASS SPECTROMETRY;

EID: 33747157657     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.248     Document Type: Article
Times cited : (8)

References (13)
  • 12
    • 33747165742 scopus 로고    scopus 로고
    • D.L. Knies, K.S. Grabowski, G.K. Hubler, D.J. Treacy, T.M. DeTurck, H.A. Enge, in: J.L. Duggan, I.L. Morgan (Eds.), Conference Proceedings on Application of Accelerators in Research and Industry, vol. 392, American Institute of Physics Press, New York, 1997, pp. 783-786.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.