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Volumn 252, Issue 19, 2006, Pages 7297-7300
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Implementing a SIMS ion source on the NRL trace element accelerator mass spectrometer
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Author keywords
Accelerator mass spectrometry; Molecular interference; Secondary ion mass spectrometry; Trace element
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Indexed keywords
ELECTROSTATICS;
ION BEAMS;
ISOTOPES;
MOLECULAR DYNAMICS;
SECONDARY ION MASS SPECTROMETRY;
ACCELERATOR MASS SPECTROMETRY;
ELECTROSTATIC ANALYZER;
MOLECULAR INTERFERENCE;
RADIOCARBON ION SOURCE;
TRACE ELEMENTS;
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EID: 33747157657
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2006.02.248 Document Type: Article |
Times cited : (8)
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References (13)
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