A new accelerator mass spectrometer for trace element analysis at the Naval Research Laboratory

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 123, Issue 1-4, 1997, Pages 566-570

  Grabowski, K S ^a   Knies, D L ^a   Hubler, G K ^a   Enge, H A ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b Deuteron Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATOR MAGNETS; IMAGE QUALITY; IMPURITIES; ION BEAMS; ION SOURCES; SECONDARY ION MASS SPECTROMETRY; TRACE ELEMENTS;

ACCELERATOR MASS SPECTROMETERS; PRETZEL MAGNETS; SPLIT POLE MASS SPECTROGRAPH;

MASS SPECTROMETERS;

EID: 0031546876     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(96)00627-1     Document Type: Article

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