Structure, properties and gas sensing effect of SnSe2 films prepared by pulsed laser deposition method

Journal of Non-Crystalline Solids

Volumn 353, Issue 18-21, 2007, Pages 1865-1869

  Popescu, M ^a   Sava, F ^a   Lorinczi, A ^a   Socol, G ^a,b   Mihailescu I N ^a,b   Tomescu, A ^a   Simion, C ^a  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^b NATIONAL INSTITUTE FOR LASER   (Romania)

Author keywords

Amorphous semiconductors; Chalcogenides; Laser deposition; Sensors; X ray diffraction

Indexed keywords

AMORPHOUS SEMICONDUCTORS; CHALCOGENIDES; CHEMICAL SENSORS; HEAT TREATMENT; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; SEMICONDUCTING TIN COMPOUNDS; X RAY DIFFRACTION;

ATOMIC SCALE STRUCTURE; GAS SENSING EFFECTS; SOLID POLYCRYSTALLINE;

AMORPHOUS FILMS;

EID: 34248212378     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.02.055     Document Type: Article

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