A cross-sectional TEM sample preparation method for films deposited on metallic substrates

Materials Characterization

Volumn 58, Issue 7, 2007, Pages 666-669

  Liu, Yan ^a   Wang, Ruobin ^a   Guo, Xinqiu ^a   Dai, Jiawei ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Cross sectional TEM sample preparation; Films; Metallic substrate; Superlattice film

Indexed keywords

DEPOSITION; METALS; SUBSTRATES; SUPERLATTICES; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY;

CROSS-SECTIONAL TEM SAMPLE PREPARATION; METALLIC SUBSTRATES; SUPERLATTICE FILMS;

THIN FILMS;

EID: 34247868084     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2006.07.016     Document Type: Article

References (5)

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