Porous silicon Bragg reflectors with sub-micrometer lateral dimensions

Optics Express

Volumn 15, Issue 9, 2007, Pages 5537-5542

  Breese, Mark B H ^a   Mangaiyarkarasi, Dharmalingam ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; ELECTRIC CURRENTS; FABRY-PEROT INTERFEROMETERS; ION BOMBARDMENT; MICROCAVITIES; MICROMETERS; POROUS SILICON;

HIGH-DENSITY ARRAYS; HIGH-ENERGY IONS; REFLECTED COLORS; SUB-MICROMETER LATERAL DIMENSIONS;

BRAGG REFLECTORS;

EID: 34247847994     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.005537     Document Type: Article

References (17)

1. G. Vincent, "Optical properties of porous silicon superlattices," Appl. Phys. Lett. 64, 2367-2369 (1994).
2. M. G. Berger, R. Arens-Fischer, M. Kruger, S. Billat, H. Luth, S. Hillbrich, W. Theiß, and P.Grosse, "Dielectric filters made of PS: advanced performance by oxidation and new layer structures," Thin Solid Films 297, 237-240 (1997).
3. M. Araki, H. Koyama, and N. Koshida, "Controlled electroluminescence spectra of porous silicon diodes with a vertical optical cavity," Appl. Phys. Lett. 69, 2956-2958 (1996).
4. L. Pavesi, "Porous silicon dielectric multilayers and microcavities," Riv. Nuovo Cimento 20, 1-78 (1997).
5. S. Nagata, C. Domoto, T. Nishimura, and K. Iwameji, "Single-mode optical waveguide fabricated by oxidization of selectively doped titanium porous silicon," Appl. Phys. Lett. 72, 2945-2947 (1998).
6. A. Birner, R. B.Wehrspohn, U. Gösele, and K. Busch, "Silicon-Based Photonic Crystals," Adv. Mater. 13, 377-388 (2001).
7. N. Savage, "Linking with light," IEEE Spectrum 39, 32-36 (2002).
8. V. Lehmann, Electrochemistry of Silicon (Wiley-VCH, Weinheim, Germany 2002).
9. D. Mangaiyarkarasi, M. B. H. Breese, Y. S. Ow, and C. Vijila, "Controlled blue-shift of the resonant wavelength in porous silicon microcavities using ion irradiation," Appl. Phys. Lett. 89 021910-(1-3) (2006).
10. M. B. H. Breese, F. J. T. Champeaux, E. J. Teo, A. A. Bettiol, and D. Blackwood, "Hole transport through proton-irradiated p-type silicon wafers during electrochemical anodization," Phys. Rev. B 73 035428(1-7) (2006).
11. D. S. Gemmell, "Channeling and related effects in the motion of charged particles through crystals" Rev. Mod. Phys. 46, 129-227 (1974).
12. L. C. Feldman, J. W. Mayer, S. T. Picraux, Materials Analysis by Ion Channeling (Acad. Press, New York, 1982).
13. P. J. C.King, M. B. H. Breese, P. J. C. Smulders, P. R. Wilshaw and G. W. Grime, "The observation of a blocking to channeling transition for MeV protons at stacking faults in silicon. Phys. Rev. Lett. 74, 411-414 (1995).
14. M. B. H. Breese, P. J. C. King, P. J. C. Smulders, and G. W. Grime, "Dechanneling of MeV protons by 60° dislocations" Phys. Rev. B 51, 2742-2750 (1995).
15. M. B. H. Breese, D. N. Jamieson and P. J.C.King, Materials Analysis using a Nuclear Microprobe, (Wiley, New York, 1996).
16. M. B. H. Breese, E. J. Teo, M. A. Rana, L. Huang, J. A. van Kan, F. Watt, and P. J. C. King, "Observation of many coherent oscillations for MeV protons transmitted through stacking faults," Phys. Rev. Lett. 92, 045503 (2004).
17. Ocean Optics http://www.oceanoptics.com/ciroducts/colorfilters.asp