Monte Carlo study of Si diode response in electron beams

Medical Physics

Volumn 34, Issue 5, 2007, Pages 1734-1742

  Wang, Lilie L W ^a   Rogers, David W O ^a  

^a CARLETON UNIVERSITY   (Canada)

Author keywords

Electron beam; Monte Carlo simulation; Radiation dosimetry; Silicon diode detector

Indexed keywords

DISSOCIATION; DOSIMETRY; ELECTRON BEAMS; ELECTRON ENERGY LEVELS; ELECTRONS; IONIZATION CHAMBERS; IONS; MONTE CARLO METHODS; SEMICONDUCTING SILICON;

CORRECTION FACTORS; ELECTRON ENERGIES; ELECTRON ENERGY RANGE; INCIDENT ELECTRON BEAMS; PARALLEL PLATES; PHANTOM SURFACE; SILICON DIODE DETECTORS; WALL CORRECTION FACTORS;

SEMICONDUCTOR DIODES;

SILICON; WATER;

ARTICLE; DIODE; ELECTRON BEAM; IONIZATION CHAMBER; MODEL; MONTE CARLO METHOD; PHANTOM; PRIORITY JOURNAL; QUALITATIVE ANALYSIS; RADIATION DOSE; RADIATION RESPONSE; SEMICONDUCTOR; UNCERTAINTY;

EID: 34247580941     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.2722720     Document Type: Article

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