XPS characterization of the corrosion film formed on the electroless nickel deposit prepared using different stabilizers in NaCl solution

Surface and Interface Analysis

Volumn 39, Issue 5, 2007, Pages 405-414

  Cheong, Woo Jae ^a,c   Luan, Ben L ^a,b   McIntyre, N S ^a   Shoesmith, David W ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^c ATOMIC ENERGY OF CANADA LIMITED   (Canada)

Author keywords

Corrosion; Electroless nickel (EN); Phosphorus enrichment; Stabilizer; Trace impurity; X ray photoelectron spectroscopy (XPS)

Indexed keywords

CORROSION; ELECTROLESS PLATING; NICKEL; SODIUM CHLORIDE; STABILIZERS (AGENTS); THIN FILMS;

CORROSION FILMS; ELECTROLESS NICKEL (EN); PHOSPHORUS ENRICHMENT; TRACE IMPURITY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 34247511206     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2531     Document Type: Article

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