Polymer anchoring layer for atomic force microscopy studies of nanoparticle-substrate interactions

Journal of Macromolecular Science, Part B: Physics

Volumn 46 B, Issue 1, 2007, Pages 231-244

  Burtovyy, Ruslan ^a,b   Liu, Yong ^a   Luzinov, Igor ^a   Zdyrko, Bogdan ^a   Tregub, Alex ^c   Moinpour, Mansour ^c   Buehler, Mark ^c  

^a AMRL   (United States)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^c INTEL CORPORATION   (United States)

Author keywords

Adhesion; AFM; Nanoparticles; Polymer layer; Surface modification

Indexed keywords

COLLOIDAL PROBES; POLYGLYCIDYL METHACRYLATE; POLYMER LAYERS;

ADHESION; ADSORPTION; ATOMIC FORCE MICROSCOPY; SILICON WAFERS; STABILITY; SURFACE TREATMENT; VINYL RESINS;

NANOPARTICLES;

EID: 34247503350     PISSN: 00222348     EISSN: 1525609X     Source Type: Journal    
DOI: 10.1080/00222340601044466     Document Type: Article

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