The influence of particle charge and roughness on particle-substrate adhesion

Powder Technology

Volumn 135-136, Issue , 2003, Pages 82-91

  Zhou, Hongben ^a   Götzinger, Martin ^a   Peukert, Wolfgang ^b  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Adhesion; AFM; Electrostatic force; Toner

Indexed keywords

ADHESION; ALUMINA; ATOMIC FORCE MICROSCOPY; ELECTRIC CHARGE; ELECTROSTATIC PRINTING; POLYSTYRENES; SUBSTRATES; VAN DER WAALS FORCES;

TONER PARTICLES;

POWDERS;

ALUMINUM; POLYSTYRENE; SILICON;

ELECTROSTATICS; PRINTING;

ADHESION; ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; ELECTRICITY; EXPERIMENTAL MODEL; FORCE; MATERIAL COATING; MATHEMATICAL ANALYSIS; MATHEMATICAL COMPUTING; MOLECULAR INTERACTION; PAPER; PARTICLE SIZE; PARTICULATE MATTER; PRINTING; STATISTICAL ANALYSIS; ULTRACENTRIFUGE;

EID: 0242383881     PISSN: 00325910     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.powtec.2003.08.007     Document Type: Article

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